EL

Detection principle

· After applying a voltage to the solar cell/module to make it emit light, a near-infrared camera is used to capture its light-emitting image, because the brightness of electroluminescence is proportional to the minority carrier diffusion length

· The defect emits weak light due to its low minority carrier diffusion length, resulting in a darker image


Schematic Diagram

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Device parameters

ProjectSpecification
Model Specifications

EL140S-M

Effective test area

170mm X 170m

Resolution

1.4 million pixels

Sensitivity

Can detect defects with contrast >5

Testing time

0.6s—10s free setting

Test method

Probe Contact

Power parameters

Single-phase 220V 10A, maximum load voltage 60V, maximum load current 10A

ConfigurationTest machine (including infrared imager), computer, professional software


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